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eGaN® FET Reliability

EPC

This presentation will discuss the reliability of commercially available enhancement mode gallium nitride transistors from EPC. To explain the devices’ reliability, this presentation will review how they operate and highlight both their similarities and differences versus today’s power MOSFETs. Additionally, this presentation will describe the reliability tests that were performed and the results achieved for EPC’s first-generation eGaN FETs.


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Related Parts

画像メーカー品番商品概要FETタイプ技術入手可能な数量
GANFET TRANS 100V 36A BUMPED DIEEPC2001CGANFET TRANS 100V 36A BUMPED DIENチャンネルGaNFET(窒化ガリウム)55793 - 即時詳細を閲覧
PTM Published on: 2011-04-06
PTM Updated on: 2016-03-30