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FC4SD Series SMD Crystal

Fox Electronics introduces an expanded range of standard frequencies for FC4SD surface-mount, low-profile crystals

Image of Fox Electronics' FC4SD Series SMD Crystal Fox Electronics' FC4SD, a resistance-welded low-profile crystal, has a frequency range of 3.2 MHz to 70 MHz and will operate in the fundamental mode up to 40 MHz. Frequency tolerance at 25°C is ±30 ppm, frequency stability is ±50 ppm, the operating temperature range is -20°C to +70°C and the storage temperature range is -40°C to +85°C. Also, the shunt capacitance is 7 pF, the standard load capacitance for parallel standard crystals is 20 pF and the drive level is 0.5 mW.

Features
  • Stock standard
  • Fundamental to 40 MHz
  • Tape and Reel available
Options
  • Tolerances to 10 PPM
  • Stabilities to 5 PPM
  • Temperatures to -40°C to +105°C
  • 3.2 mm height max

FC4SD Series SMD Crystal

ImageManufacturer Part NumberDescriptionTypeAvailable Quantity
CRYSTAL 25.0000MHZ 20PF SMDFC4SDCBMF25.0-T1CRYSTAL 25.0000MHZ 20PF SMDMHz Crystal29627 - ImmediateView Details
CRYSTAL 10.0000MHZ 20PF SMDFC4SDCBMF10.0-T1CRYSTAL 10.0000MHZ 20PF SMDMHz Crystal23128 - ImmediateView Details
CRYSTAL 8.0000MHZ 20PF SMDFC4SDCBMF8.0-T1CRYSTAL 8.0000MHZ 20PF SMDMHz Crystal70214 - ImmediateView Details
CRYSTAL 3.6864MHZ 20PF SMDFC4SDCBMF3.6864-T1CRYSTAL 3.6864MHZ 20PF SMDMHz Crystal20239 - ImmediateView Details
CRYSTAL 11.0592MHZ 20PF SMDFC4SDCBMF11.0592-T1CRYSTAL 11.0592MHZ 20PF SMDMHz Crystal32855 - ImmediateView Details
CRYSTAL 6.0000MHZ 20PF SMDFC4SDCBMF6.0-T1CRYSTAL 6.0000MHZ 20PF SMDMHz Crystal3979 - ImmediateView Details
CRYSTAL 4.0000MHZ 20PF SMDFC4SDCBMF4.0-T1CRYSTAL 4.0000MHZ 20PF SMDMHz Crystal16394 - ImmediateView Details
CRYSTAL 12.2880MHZ 20PF SMDFC4SDCBMF12.288-T1CRYSTAL 12.2880MHZ 20PF SMDMHz Crystal2484 - ImmediateView Details
CRYSTAL 18.4320MHZ 20PF SMDFC4SDCBMF18.432-T1CRYSTAL 18.4320MHZ 20PF SMDMHz Crystal560 - ImmediateView Details
CRYSTAL 12.0000MHZ 20PF SMDFC4SDCBMM12.0-T1CRYSTAL 12.0000MHZ 20PF SMDMHz Crystal876 - ImmediateView Details
Published: 2009-08-07