@ RoHS (/) @ Halogen-Free
11 It i‘ fl I‘ l!
Mg
eGaN® FET DATASHEET EPC2010C
EPC – POWER CONVERSION TECHNOLOGY LEADER | EPC-CO.COM | ©2021 | | 1
EPC2010C – Enhancement Mode Power Transistor
VDS , 200 V
RDS(on) , 25 mΩ
ID , 22 A
EPC2010C eGaN® FETs are supplied only in
passivated die form with solder bars
Applications
• High Speed DC-DC conversion
• Class D Audio
• Lidar
Benefits
• Ultra High Efficiency
• Ultra Low RDS(on)
• Ultra Low QG
• Ultra Small Footprint
EFFICIENT POWER CONVERSION
G
D
HAL
Maximum Ratings
PARAMETER VALUE UNIT
VDS Drain-to-Source Voltage (Continuous) 200 V
ID
Continuous (TA = 25°C, RθJA = 5.3) 22 A
Pulsed (25°C, TPULSE = 300 µs) 90
VGS
Gate-to-Source Voltage 6V
Gate-to-Source Voltage -4
TJOperating Temperature -40 to 150 °C
TSTG Storage Temperature -40 to 150
Thermal Characteristics
PARAMETER TYP UNIT
RθJC Thermal Resistance, Junction-to-Case 1.1
°C/W RθJB Thermal Resistance, Junction-to-Board 2.7
RθJA Thermal Resistance, Junction-to-Ambient (Note 1) 56
Note 1: RθJA is determined with the device mounted on one square inch of copper pad, single layer 2 oz copper on FR4 board.
See https://epc-co.com/epc/documents/product-training/Appnote_Thermal_Performance_of_eGaN_FETs.pdf for details.
All measurements were done with substrate connected to source.
Static Characteristics (TJ = 25°C unless otherwise stated)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
BVDSS Drain-to-Source Voltage VGS = 0 V, ID = 200 μA 200 V
IDSS Drain-Source Leakage VGS = 0 V, VDS = 160 V 50 150 µA
IGSS
Gate-to-Source Forward Leakage VGS = 5 V 1 3 mA
Gate-to-Source Reverse Leakage VGS = -4 V 50 150 µA
VGS(TH) Gate Threshold Voltage VDS = VGS, ID = 3 mA 0.8 1.4 2.5 V
RDS(on) Drain-Source On Resistance VGS = 5 V, ID = 12 A 18 25 mΩ
VSD Source-Drain Forward Voltage IS = 0.5 A, VGS = 0 V 1.7 V
Gallium Nitride’s exceptionally high electron mobility and low temperature coefficient allows very
low RDS(on), while its lateral device structure and majority carrier diode provide exceptionally low QG
and zero QRR. The end result is a device that can handle tasks where very high switching frequency,
and low on-time are beneficial as well as those where on-state losses dominate.