NB3L553 Datasheet by ON Semiconductor

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2.5V/3.3V/5.0V 1:4 Clock Fanout Buffer 0N Semiconductor® HERE «A L HHHH 9 6PM HHHH HHHH
© Semiconductor Components Industries, LLC, 2017
March, 2021 Rev. 11
1Publication Order Number:
NB3L553/D
2.5 V / 3.3 V / 5.0 V
1:4 Clock Fanout Buffer
NB3L553
Description
The NB3L553 is a low skew 1to 4 clock fanout buffer, designed for
clock distribution in mind. The NB3L553 specifically guarantees low
outputtooutput skew. Optimal design, layout and processing
minimize skew within a device and from device to device.
Features
Input/Output Clock Frequency up to 200 MHz
Low Skew Outputs (35 ps), Typical
RMS Phase Jitter (12 kHz – 20 MHz): 29 fs (Typical)
Output goes to ThreeState Mode via OE
Operating Range: VDD = 2.375 V to 5.25 V
5 V Tolerant Input Clock ICLK
Ideal for Networking Clocks
Packaged in 8pin SOIC
Industrial Temperature Range
These are PbFree Devices
Figure 1. Block Diagram
ICLK
Q1
Q2
Q3
Q4
OE
Device Package Shipping
ORDERING INFORMATION
NB3L553DG SOIC8
(PbFree)
98 Units/Rail
SOIC8
D SUFFIX
CASE 751
MARKING DIAGRAMS*
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1
8
3L553 = Specific Device Code
A = Assembly Location
L = Wafer Lot
Y = Year
W = Work Week
G= PbFree Package
3L553
ALYW
G
1
8
NB3L553DR2G SOIC8
(PbFree)
2500/Tape & Reel
For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
ICLK
Q2
Q3
OE
VDD
Q0
Q1
GND
PINOUT DIAGRAM
1
DFN8
MN SUFFIX
CASE 506AA
6P = Specific Device Code
M= Date Code
G= PbFree Package
6P MG
G
1
NB3L553MNR4G DFN8
(PbFree)
1000/Tape & Reel
(Note: Microdot may be in either location)
1
2
3
4
8
7
6
5
*For additional marking information, refer to
Application Note AND8002/D.
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2
Table 1. OE, OUTPUT ENABLE FUNCTION
OE Function
0 Disable
1 Enable
Table 2. PIN DESCRIPTION
Pin # Name Type Description
1 VDD Power Positive supply voltage (2.375 V to 5.25 V)
2 Q0 (LV)CMOS/(LV)TTL Output Clock Output 0
3 Q1 (LV)CMOS/(LV)TTL Output Clock Output 1
4 GND Power Negative supply voltage; Connect to ground, 0 V
5 ICLK (LV)CMOS Input Clock Input. 5.0 V tolerant
6 Q2 (LV)CMOS/(LV)TTL Output Clock Output 2
7 Q3 (LV)CMOS/(LV)TTL Output Clock Output 3
8 OE (LV)TTL Input VDD for normal operation. Pin has no internal pullup or pull down resistor for open
condition default. Use from 1 to 10 kOhms external resistor to force an open con-
dition default state.
EP Thermal Exposed Pad (DFN8 only) Thermal exposed pad must be connected to a sufficient thermal
conduit. Electrically connect to the most negative supply (GND) or leave uncon-
nected, floating open.
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3
Table 3. MAXIMUM RATINGS
Symbol Parameter Condition 1 Condition 2 Rating Unit
VDD Positive Power Supply GND = 0 V 6.0 V
VIInput Voltage OE
ICLK
GND = 0 V and
VDD = 2.375 V to 5.25 V
GND – 0.5 v VI v VDD + 0.5
GND – 0.5 v VI v 5.75
V
TAOperating Temperature Range,
Industrial
− − 40 to +85 °C
Tstg Storage Temperature Range − − 65 to +150 °C
qJA Thermal Resistance
(JunctiontoAmbient)
0 lfpm
500 lfpm
SOIC8 190
130
°C/W
°C/W
qJC Thermal Resistance (JunctiontoCase) (Note 1) SOIC841 to 44 °C/W
qJA Thermal Resistance
(JunctiontoAmbient)
0 lfpm
500 lfpm
DFN8
DFN8
129
84
°C/W
°C/W
qJC Thermal Resistance (JunctiontoCase) (Note 1) DFN8 35 to 40 °C/W
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. JEDEC standard multilayer board 2S2P (2 signal, 2 power)
Table 4. ATTRIBUTES
Characteristic Value
ESD Protection Human Body Model
Machine Model
Charged Device Model
> 2 kV
> 150 V
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2) Level 1
Flammability Rating Oxygen Index: 28 to 34 UL94 code V0 @ 0.125 in
Transistor Count 531 Devices
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
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Table 5. DC CHARACTERISTICS (VDD = 2.375 V to 2.625 V, GND = 0 V, TA = 40°C to +85°C) (Note 3)
Symbol Characteristic Min Typ Max Unit
IDD Power Supply Current @ 135 MHz, No Load 25 30 mA
VOH Output HIGH Voltage – IOH = 16 mA 1.7 V
VOL Output LOW Voltage – IOL = 16 mA 0.4 V
VIH, ICLK Input HIGH Voltage, ICLK (VDD÷2)+0.5 5.0 V
VIL, ICLK Input LOW Voltage, ICLK (VDD÷2)0.5 V
VIH, OE Input HIGH Voltage, OE 1.8 VDD V
VIL, OE Input LOW Voltage, OE 0.7 V
ZO Nominal Output Impedance 20 W
CIN Input Capacitance, ICLK, OE 5.0 pF
IOS Short Circuit Current ± 28 mA
DC CHARACTERISTICS (VDD = 3.15 V to 3.45 V, GND = 0 V, TA = 40°C to +85°C) (Note 3)
Symbol Characteristic Min Typ Max Unit
IDD Power Supply Current @ 135 MHz, No Load 35 40 mA
VOH Output HIGH Voltage – IOH = 25 mA 2.4 V
VOL Output LOW Voltage – IOL = 25 mA 0.4 V
VOH Output HIGH Voltage – IOH = 12 mA (CMOS level) VDD 0.4 V
VIH, ICLK Input HIGH Voltage, ICLK (VDD÷2)+0.7 5.0 V
VIL, ICLK Input LOW Voltage, ICLK (VDD÷2)0.7 V
VIH, OE Input HIGH Voltage, OE 2.0 VDD V
VIL, OE Input LOW Voltage, OE 00.8 V
ZO Nominal Output Impedance 20 W
CIN Input Capacitance, OE 5.0 pF
IOS Short Circuit Current ± 50 mA
DC CHARACTERISTICS (VDD = 4.75 V to 5.25 V, GND = 0 V, TA = 40°C to +85°C) (Note 3)
Symbol Characteristic Min Typ Max Unit
IDD Power Supply Current @ 135 MHz, No Load 45 85 mA
VOH Output HIGH Voltage – IOH = 35 mA 2.4 V
VOL Output LOW Voltage – IOL = 35 mA 0.4 V
VOH Output HIGH Voltage – IOH = 12 mA (CMOS level) VDD 0.4 V
VIH, ICLK Input HIGH Voltage, ICLK (VDD÷2) + 1 5.0 V
VIL, ICLK Input LOW Voltage, ICLK (VDD÷2) 1 V
VIH, OE Input HIGH Voltage, OE 2.0 VDD V
VIL, OE Input LOW Voltage, OE 0.8 V
ZO Nominal Output Impedance 20 W
CIN Input Capacitance, OE 5.0 pF
IOS Short Circuit Current ± 80 mA
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Table 6. AC CHARACTERISTICS; VDD = 2.5 V +5% (VDD = 2.375 V to 2.625 V, GND = 0 V, TA = 40°C to +85°C) (Note 3)
Symbol Characteristic Min Typ Max Unit
fin Input Frequency 200 MHz
tr/tfOutput rise and fall times; 0.8 V to 2.0 V 1.0 1.5 ns
tpd Propagation Delay, CLK to Qn (Note 4) 2.2 3.0 5.0 ns
tskew Outputtooutput skew; (Note 5) 35 50 ps
tskew Devicetodevice skew, (Note 5) 500 ps
AC CHARACTERISTICS; VDD = 3.3 V +5% (VDD = 3.15 V to 3.45 V, GND = 0 V, TA = 40°C to +85°C) (Note 3)
Symbol Characteristic Conditions Min Typ Max Unit
fin Input Frequency 200 MHz
tjitter (f)RMS Phase Jitter (Integrated 12 kHz
20 MHz) (See Figures 2 and 3)
fcarrier = 100 MHz 18 fs
tr/tfOutput rise and fall times; 0.8 V to 2.0 V 0.6 1.0 ns
tpd Propagation Delay, CLK to Qn (Note 4) 2.0 2.4 4.0 ns
tskew Outputtooutput skew; (Note 5) 35 50 ps
tskew Devicetodevice skew, (Note 5) 500 ps
AC CHARACTERISTICS; VDD = 5.0 V +5% (VDD = 4.75 V to 5.25 V, GND = 0 V, TA = 40°C to +85°C) (Note 3)
Symbol Characteristic Min Min Typ Max Unit
fin Input Frequency 200 MHz
tjitter (f)RMS Phase Jitter (Integrated 12 kHz
20 MHz) (See Figures 2 and 3)
fcarrier = 100 MHz 29 fs
tr/tfOutput rise and fall times; 0.8 V to 2.0 V 0.3 0.7 ns
tpd Propagation Delay, CLK to Qn (Note 4) 1.7 2.5 4.0 ns
tskew Outputtooutput skew; (Note 5) 35 50 ps
tskew Devicetodevice skew, (Note 5) 500 ps
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
3. Outputs loaded with external RL = 33 W series resistor and CL = 15 pF to GND. Duty cycle out = duty in. A 0.01 mF decoupling capacitor should
be connected between VDD and GND.
4. Measured with railtorail input clock
5. Measured on rising edges at VDD ÷ 2 between any two outputs with equal loading.
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NB3L553
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6
Figure 2. Phase Noise Plot at 100 MHz at an Operating Voltage of 3.3 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3L553 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded area) is 18 fs (RMS Phase Jitter of the input source is 75.40 fs and Output (DUT+Source) is 93.16 fs).
Figure 3. Phase Noise Plot at 100 MHz at an Operating Voltage of 5 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3L553 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded area) is 29 fs (RMS Phase Jitter of the input source is 75.40 fs and Output (DUT+Source) is 103.85 fs).
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DFN8 2x2, 0.5P
CASE 506AA01
ISSUE E
DATE 22 JAN 2010
SCALE 4:1
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994 .
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.20 MM FROM TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
A
D
E
B
C0.10
PIN ONE
2X
REFERENCE
2X
TOP VIEW
SIDE VIEW
BOTTOM VIEW
A
L
(A3)
D2
E2
C
C0.10
C0.10
C0.08
NOTE 4 A1 SEATING
PLANE
e/2
e
8X
K
NOTE 3
b
8X
0.10 C
0.05 C
ABB
DIM MIN MAX
MILLIMETERS
A0.80 1.00
A1 0.00 0.05
A3 0.20 REF
b0.20 0.30
D2.00 BSC
D2 1.10 1.30
E2.00 BSC
E2 0.70 0.90
e0.50 BSC
K
L0.25 0.35
1
14
85
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
SOLDERING FOOTPRINT*
2.30
0.50
0.50
8X
DIMENSIONS: MILLIMETERS
0.30 PITCH
*This information is generic. Please refer to
device data sheet for actual part marking.
PbFree indicator, “G” or microdot “ G”,
may or may not be present.
GENERIC
MARKING DIAGRAM*
8X
1
PACKAGE
OUTLINE
RECOMMENDED
XX = Specific Device Code
M = Date Code
G= PbFree Device
XXMG
G
1
L1
DETAIL A
L
OPTIONAL
CONSTRUCTIONS
L
DETAIL B
MOLD CMPDEXPOSED Cu
OPTIONAL
CONSTRUCTION
DETAIL B
DETAIL A
L1 −−− 0.10
0.30 REF
0.90
1.30
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
98AON18658D
DOCUMENT NUMBER:
DESCRIPTION:
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
DFN8, 2.0X2.0, 0.5MM PITCH
© Semiconductor Components Industries, LLC, 2019 www.onsemi.com
0N Semiwndudw" m @ HHHH HHHH HHHH HERE 4 FUDGE] !HHH !HHH gHHH EHHH 1 1 } x ‘ 1 (...... a. ............. ... ......M .. SW. CW ........ .. ... 0. SW .. W- .. ...... ...... ...... ...... 0. SW ...... ... .... .. .... ...... ...... .. ... ...... ...... o. ......m... .. ...... .. ...... ...... ... 5...... .. .. ...... ... .. ...... a. s............ ...... ... ...... ...... ...... .....w... .. .. ... ...... ......w... ....-. ... ... ... ...... ...... ...... ...... ...5......... .. ...... ...... o. 5.--.-. .... ...... ... ...... ...... .... ..............
SOIC8 NB
CASE 75107
ISSUE AK
DATE 16 FEB 2011
SEATING
PLANE
1
4
58
N
J
X 45 _
K
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 75101 THRU 75106 ARE OBSOLETE. NEW
STANDARD IS 75107.
A
BS
D
H
C
0.10 (0.004)
SCALE 1:1
STYLES ON PAGE 2
DIM
A
MIN MAX MIN MAX
INCHES
4.80 5.00 0.189 0.197
MILLIMETERS
B3.80 4.00 0.150 0.157
C1.35 1.75 0.053 0.069
D0.33 0.51 0.013 0.020
G1.27 BSC 0.050 BSC
H0.10 0.25 0.004 0.010
J0.19 0.25 0.007 0.010
K0.40 1.27 0.016 0.050
M0 8 0 8
N0.25 0.50 0.010 0.020
S5.80 6.20 0.228 0.244
X
Y
G
M
Y
M
0.25 (0.010)
Z
Y
M
0.25 (0.010) ZSXS
M
____
XXXXX = Specific Device Code
A = Assembly Location
L = Wafer Lot
Y = Year
W = Work Week
G= PbFree Package
GENERIC
MARKING DIAGRAM*
1
8
XXXXX
ALYWX
1
8
IC Discrete
XXXXXX
AYWW
G
1
8
1.52
0.060
7.0
0.275
0.6
0.024
1.270
0.050
4.0
0.155
ǒmm
inchesǓ
SCALE 6:1
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
SOLDERING FOOTPRINT*
Discrete
XXXXXX
AYWW
1
8
(PbFree)
XXXXX
ALYWX
G
1
8
IC
(PbFree)
XXXXXX = Specific Device Code
A = Assembly Location
Y = Year
WW = Work Week
G= PbFree Package
*This information is generic. Please refer to
device data sheet for actual part marking.
PbFree indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
98ASB42564B
DOCUMENT NUMBER:
DESCRIPTION:
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 2
SOIC8 NB
© Semiconductor Components Industries, LLC, 2019 www.onsemi.com
ON Semxcunduclm and ave hademavks av Semxcanduclur Campunenls lnduslnes. uc dha ON Semxcanduclar Dr K: suhsxdmnes m xna Umled sxaxas andJm mhev cmm‘nes ON Semxcunduclar vesewes me “gm to make changes wuhum mnna. mouse to any pruduns necem ON Semanduc‘m makes nu wanamy. represenlalmn m guarantee regardmg ma sumahmly at W; manual: can any pamcu‘av purpase nnv dues ON Semumnduclm assume any Mammy snsmg mm xna aapncauan m use M any pmduclnv mum and specmcsl‘y dwsc‘axms any and an Mammy mc‘udmg wxlham hmma‘mn spema‘ cansequemm m \nmdeula‘ damages ON Semxmnduclar dues nn| away any hcense under Ms pa|EM nghls Ivar xna ngms av mhers
SOIC8 NB
CASE 75107
ISSUE AK
DATE 16 FEB 2011
STYLE 4:
PIN 1. ANODE
2. ANODE
3. ANODE
4. ANODE
5. ANODE
6. ANODE
7. ANODE
8. COMMON CATHODE
STYLE 1:
PIN 1. EMITTER
2. COLLECTOR
3. COLLECTOR
4. EMITTER
5. EMITTER
6. BASE
7. BASE
8. EMITTER
STYLE 2:
PIN 1. COLLECTOR, DIE, #1
2. COLLECTOR, #1
3. COLLECTOR, #2
4. COLLECTOR, #2
5. BASE, #2
6. EMITTER, #2
7. BASE, #1
8. EMITTER, #1
STYLE 3:
PIN 1. DRAIN, DIE #1
2. DRAIN, #1
3. DRAIN, #2
4. DRAIN, #2
5. GATE, #2
6. SOURCE, #2
7. GATE, #1
8. SOURCE, #1
STYLE 6:
PIN 1. SOURCE
2. DRAIN
3. DRAIN
4. SOURCE
5. SOURCE
6. GATE
7. GATE
8. SOURCE
STYLE 5:
PIN 1. DRAIN
2. DRAIN
3. DRAIN
4. DRAIN
5. GATE
6. GATE
7. SOURCE
8. SOURCE
STYLE 7:
PIN 1. INPUT
2. EXTERNAL BYPASS
3. THIRD STAGE SOURCE
4. GROUND
5. DRAIN
6. GATE 3
7. SECOND STAGE Vd
8. FIRST STAGE Vd
STYLE 8:
PIN 1. COLLECTOR, DIE #1
2. BASE, #1
3. BASE, #2
4. COLLECTOR, #2
5. COLLECTOR, #2
6. EMITTER, #2
7. EMITTER, #1
8. COLLECTOR, #1
STYLE 9:
PIN 1. EMITTER, COMMON
2. COLLECTOR, DIE #1
3. COLLECTOR, DIE #2
4. EMITTER, COMMON
5. EMITTER, COMMON
6. BASE, DIE #2
7. BASE, DIE #1
8. EMITTER, COMMON
STYLE 10:
PIN 1. GROUND
2. BIAS 1
3. OUTPUT
4. GROUND
5. GROUND
6. BIAS 2
7. INPUT
8. GROUND
STYLE 11:
PIN 1. SOURCE 1
2. GATE 1
3. SOURCE 2
4. GATE 2
5. DRAIN 2
6. DRAIN 2
7. DRAIN 1
8. DRAIN 1
STYLE 12:
PIN 1. SOURCE
2. SOURCE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
STYLE 14:
PIN 1. NSOURCE
2. NGATE
3. PSOURCE
4. PGATE
5. PDRAIN
6. PDRAIN
7. NDRAIN
8. NDRAIN
STYLE 13:
PIN 1. N.C.
2. SOURCE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
STYLE 15:
PIN 1. ANODE 1
2. ANODE 1
3. ANODE 1
4. ANODE 1
5. CATHODE, COMMON
6. CATHODE, COMMON
7. CATHODE, COMMON
8. CATHODE, COMMON
STYLE 16:
PIN 1. EMITTER, DIE #1
2. BASE, DIE #1
3. EMITTER, DIE #2
4. BASE, DIE #2
5. COLLECTOR, DIE #2
6. COLLECTOR, DIE #2
7. COLLECTOR, DIE #1
8. COLLECTOR, DIE #1
STYLE 17:
PIN 1. VCC
2. V2OUT
3. V1OUT
4. TXE
5. RXE
6. VEE
7. GND
8. ACC
STYLE 18:
PIN 1. ANODE
2. ANODE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. CATHODE
8. CATHODE
STYLE 19:
PIN 1. SOURCE 1
2. GATE 1
3. SOURCE 2
4. GATE 2
5. DRAIN 2
6. MIRROR 2
7. DRAIN 1
8. MIRROR 1
STYLE 20:
PIN 1. SOURCE (N)
2. GATE (N)
3. SOURCE (P)
4. GATE (P)
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
STYLE 21:
PIN 1. CATHODE 1
2. CATHODE 2
3. CATHODE 3
4. CATHODE 4
5. CATHODE 5
6. COMMON ANODE
7. COMMON ANODE
8. CATHODE 6
STYLE 22:
PIN 1. I/O LINE 1
2. COMMON CATHODE/VCC
3. COMMON CATHODE/VCC
4. I/O LINE 3
5. COMMON ANODE/GND
6. I/O LINE 4
7. I/O LINE 5
8. COMMON ANODE/GND
STYLE 23:
PIN 1. LINE 1 IN
2. COMMON ANODE/GND
3. COMMON ANODE/GND
4. LINE 2 IN
5. LINE 2 OUT
6. COMMON ANODE/GND
7. COMMON ANODE/GND
8. LINE 1 OUT
STYLE 24:
PIN 1. BASE
2. EMITTER
3. COLLECTOR/ANODE
4. COLLECTOR/ANODE
5. CATHODE
6. CATHODE
7. COLLECTOR/ANODE
8. COLLECTOR/ANODE
STYLE 25:
PIN 1. VIN
2. N/C
3. REXT
4. GND
5. IOUT
6. IOUT
7. IOUT
8. IOUT
STYLE 26:
PIN 1. GND
2. dv/dt
3. ENABLE
4. ILIMIT
5. SOURCE
6. SOURCE
7. SOURCE
8. VCC
STYLE 27:
PIN 1. ILIMIT
2. OVLO
3. UVLO
4. INPUT+
5. SOURCE
6. SOURCE
7. SOURCE
8. DRAIN
STYLE 28:
PIN 1. SW_TO_GND
2. DASIC_OFF
3. DASIC_SW_DET
4. GND
5. V_MON
6. VBULK
7. VBULK
8. VIN
STYLE 29:
PIN 1. BASE, DIE #1
2. EMITTER, #1
3. BASE, #2
4. EMITTER, #2
5. COLLECTOR, #2
6. COLLECTOR, #2
7. COLLECTOR, #1
8. COLLECTOR, #1
STYLE 30:
PIN 1. DRAIN 1
2. DRAIN 1
3. GATE 2
4. SOURCE 2
5. SOURCE 1/DRAIN 2
6. SOURCE 1/DRAIN 2
7. SOURCE 1/DRAIN 2
8. GATE 1
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