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CX2016DB Series Spec Datasheet

Kyocera International Inc. Electronic Components

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Datasheet

KYOCERA Crystal Device Corporation
KBS-5079E
Specifications
Drawing No. K1101-13745-372 1/11
Issued Date. Jan,23,2014
TO: Digi-Key
NoteIn case of specification change, KYOCERA Part Number also will be changed.
Product Name Quartz Crystal
Product Model CX2016DB
Frequency Refer to K1101-13745-372 3/11 Nominal Frequency
Customer Part Number -
Customer Specification Number -
KYOCERA Part Number Refer to K1101-13745-372 3/12 KYOCERA Part Number
Remarks Pb-FreeRoHS CompliantMSL 1
Customer Acceptance
Accept Signature Approved Date
Department
Person in charge
Seller Manufacturer
KYOCERA Corporation KYOCERA Crystal Device Corporation
6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 5850, Higashine-Koh, Higashine-Shi, Yamagata
612-8501 Japan 999-3701 Japan
TEL. No. 075-604-3500 TEL. No. 0237-43-5611
FAX. No. 075-604-3501 FAX. No. 0237-43-5615
Design Department Quality Assurance Approved by Checked by Issued by
KYOCERA Crystal Device Corporation
Crystal Units Engineering Section
Crystal Units Division
A. Kikuchi
Y.Takahashi
T. Nitoube
Y. K i k u c h i
Drawing No. K1101-13745-372 2/11
KYOCERA Crystal Device Corporation
KBS-5079E
Revision History
Rev.No. Description of revise Date Approved by Checked by Issued by
1 First Edition Jul,29,2013 Y.Takahashi T. Nitoube Y. Kikuchi
2 Frequency Addition.
16000kHz, 20000kHz Jan,23,2014 Y.Takahashi T. Nitoube Y. Kikuchi
Drawing No. K1101-13745-372 3/11
KYOCERA Crystal Device Corporation
KBS-5079E
[PART NUMBER LIST]
Nominal Frequency
(MHz) KYOCERA Part Number ESR
()
Nominal
Frequency
Code
16.000 CX2016DB16000D0FLJCC 200 16000
20.000 CX2016DB20000D0FLJCC 150 20000
26.000 CX2016DB26000D0FLJCC 80 26000
32.000 CX2016DB32000D0FLJCC 80 32000
38.400 CX2016DB38400D0FLJCC 60 38400
40.000 CX2016DB40000D0FLJCC 50 40000
Drawing No. K1101-13745-372 4/11
KYOCERA Crystal Device Corporation
KBS-5079E
1. APPLICATION
This specification sheet is applied to quartz crystal “CX2016DB”
2. KYOCERA PART NUMBER
Refer to K1101-13745-372 3/11 KYOCERA Part Number
3. RATINGS
Items SYMB. Rating Unit Remarks
Operating Temperature Topr -30 to +85 °C
Storage Temperature range Tstg -40 to +85 °C
4. CHARACTERISTICS
ELECTRICAL CHARACTERISTICS
Items Electrical Specification Test Condition Remarks
SYMB. Min Typ. Max Unit
Mode of Vibration Fundamental
Nominal Frequency F0 1 MHz
Nominal
Temperature
TNOM 25 °C
Load Capacitance CL 8.0 pF
Frequency
Tolerance
df/F -10.0 +10.0
PPM
+25±3°C
Frequency
Temperature
characteristics
df/F -15.0 +15.0 -30 to +85°C
Frequency Ageing
Rate
-1.0 +1.0 1 year +25±3°C
Equivalent Series
Resistance
ESR 2
Drive Level Pd 0.01 100 μW
Insulation
Resistance
IR 500 M 100V(DC)
1 Refer to K1101-13745-372 3/11 Nominal Frequency
2 Refer to K1101-13745-372 3/11 ESR
Drawing No. K1101-13745-372 5/11
KYOCERA Crystal Device Corporation
KBS-5079E
5. APPEARANCES, PHYSICAL DIMENSION
OUTLINE DIMENSION (not to scale)
MARKING
1 Nominal Frequency Move the number of maximum indication beams of the
frequency to five digitsand omit less than kHz
2 Identification [K] mark is surely 1Pin direction.
3 Date Code YearLAST 1 DIGIT of YEAR AND WEEK
(Ex)Jan,01, 2014 401
4 Manufacturing Location YYamagata
ZShiga Yohkaichi
TThailand
FPhilippines
3 Refer to K1101-3745-372 3/11 Nominal Frequency Code
The font of marking is reference.
PIN
NO.
PIN Layout
#1 HOT
#2 GND
#3 HOT
#4 GND
UNIT mm
0.40±0.05
3
1.60±0.10
2.00±0.10
4R0.10
TOP VIEW
40.57±0.10
40.4
9
±0.10
C 0.20
0.15±0.025
2
3
K401 Y
4
#1
#3
#4
#2
#3 HOT
#1
1
40.10
#2 GND #1 HOT
#4 GND
#4 #3
#2
4-0.08
Drawing No. K1101-13745-372 6/11
KYOCERA Crystal Device Corporation
KBS-5079E
6. RECOMMENDED LAND PATTERN (not to scale)
UNIT mm
0.9 0.9
0.5
0.
8
0.
8
0.
3
1.1
1.4
Drawing No. K1101-13745-372 7/11
KYOCERA Crystal Device Corporation
KBS-5079E
7. TAPING&REEL
7-1.Dimensions
7-2.Leader and trailer tape
7-3.DirectionThe direction shall be seen from the top cover tape side
7-4.Specification
1. Material of the carrier tape shall be polystyrene or APET (ESD).
2. Material of the seal tape shall be polyester (ESD).
3. The seal tape shall not cover the sprocket holes. And not protrude from the carrier tape.
4. Tensile strength of the tape: 10N or more.
5. The R of the corner without designation is 0.2RMAX.
6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less.
7. Cumulative pitch tolerance of “P0” shall be ±0.2mm at 10 pitches.
8. Suppose that it unifies as shown in the above-mentioned figure to the directivity of printing in an embossing tape.
9. Peeling force of the seal tape: 0.1 to 1.0N.
10. The component can fall headlong naturally from taping in the environment, such dry conditions, when this
components were transferred to, cover was removed and the component was moved upside down.
165°180° Cover tape
END START
Leader
Empty compartment
Component
Empty compartment
100200mm
400560mm
160mm or more
Unreeling direction
12345
K123 Y
12345
K123 Y
12345
K123 Y
12345
K123 Y
3.5±0.05
4.0±0.1
2.0±0.05
4.0±0.1
φ1.05±0.05 φ1.5±
2.30±0.05
1.75±0.1
8.0±0.
2
1.90±0.1
0.7±0.05
0.2±0.0
5
Unreeling direction
1.95±0.1
2.35±0.10
0.1
0
Career tape
Drawing No. K1101-13745-372 8/11
KYOCERA Crystal Device Corporation
KBS-5079E
7-5.Reel Specification
In the case of φ180 Reel (3,000 pcs max, every 1,000 pcs)
Symbol A B C D
Dimension φ180 +0/-3 φ60 +1/-0 φ13±0.2 φ21±0.8
Symbol E W t
Dimension 2.0±0.5 9±1 2.0±0.5
(Unit : mm)
In the case of φ330 Reel (12,000 pcs max, every 1,000 pcs)
Symbol A B C D
Dimension φ330±2.0 φ100±1.0 φ13±0.2 φ21±0.8
Symbol E W t
Dimension 2.0±0.5 9.5±0.5 2.2±0.1
(Unit : mm)
A
C
D
E
B
Wt
Drawing No. K1101-13745-372 9/11
KYOCERA Crystal Device Corporation
KBS-5079E
8.Enviromental requirements
After following test, frequency shall not change more than ±10×10-6
And CI,±20% or 5 of large value.
8.1 Resistance to Shock Test condition
Natural dropped from height 100cm onto hard wood
board in 3 times
8.2 Resistance to Vibration Test condition
frequency 10 - 55 - 10 Hz
Amplitude 1.5mm
Cycle time 15 minutes
Direction X,Y,Z (3direction),2 h each.
8.3 Resistance to Heat Test condition
The quartz crystal unit shall be stored at a
temperature of +85±2°C for 500 h.
Then it shal be subjected to standard atmospheric
conditions for 1 h ,after whichi measurement shall
be made.
8.4 Resistance to Cold Test condition
The quartz crystal unit shall be stored at a
temperature of -40±2°C for 500 h.
Then it shal be subjected to standard atmospheric
conditions for 1 h ,after whichi measurement shall
be made.
8.5 Thermal Shock Test condition
The quartz crystal unit shall be subjected to 500
succesive change of temperature cycles each as
shown in table belowThen it shall be subjected
to standard atmospheric conditions for 1hafter
which measurements shall be made.
Cycle -40±2°C30min.to +25±2°C5min.
to +85±2°C30min.to +25±2°C5min.
Drawing No. K1101-13745-372 10/11
KYOCERA Crystal Device Corporation
KBS-5079E
8.6 Resistance to Moisture Test condition
The quartz crystal unit shall be stored at a
temperature of +60±2°C wich relative humidity of
90% to 95% for 240 h. Then it shall be subjected
to standard atmospheric conditions for 1hafter
which measurements shall be made
8.7 Soldering condition 1. Material of solder
Kind lead free solder paste
Melting point +220±5°C
2. Reflow temp.profile
Frequency shift : ±2ppm
3. Hand Soldering +350°C 3 sec MAX
4. Reflow Times 2 times
Reflow temp.profile
8.8 Intensity for bending in circuit board
Solder this product in center of the circuit board of 40
mm
×100
mm
and add the deflection of 3mm as the bottom figure.
Test board : t1.6mm
Temp [°C] Time[sec]
Preheating +150 to +180 150 (typ.)
Peak +260±5 10 (max.)
To t al 300 (max.)
20
PUSH
board 10
1.6
R5
R230
Product
press jig
UNIT : mm
45
45
Drawing No. K1101-13745-372 11/11
KYOCERA Crystal Device Corporation
KBS-5079E
9. Cautions for use
1Automatic mounting machine use
Please use after affirmation that select the mounting machine model with a shock small if possible in the
case of use of an automatic mounting machine, and it does not have breakage. There is a risk of a crystal
oscillating child's breakage occurring and not functioning normally by too much shock etc.
2Conformity of a circuit
In case of use of an oscillation circuit, please insert in a crystal oscillating child in series resistance 5 times
as many as the standard value of equivalent in-series resistance, and confirm oscillating. Please remove
resistance which inserted after the notes above-mentioned examination in the crystal oscillating child in
series, and use it.
10.Storage conditions
Storage at prolonged high temperature or low temperature and the storage by high humidity cause degradation
of frequency accuracy, and degradation of soldering nature. Storage is performed at the temperature of
+18 to +30°C, and the humidity of 20 to 70 % in the state of packing, and a term is 6 months.
11. Manufacturing location
Kyocera Crystal Device Corporation
Kyocera Crystal Device Corporation Shiga Yohkaichi Plant
Kyocera Crystal Device (Thailand) Co., Ltd
Kyocera Crystal Device Philippines, Inc.
12. Quality Assurance
Kyocera Crystal Device Quality Assurance Division
13. Quality guarantee
When the failure by the responsibility of our company occurs clearly after delivery within 1 year, a substitute
article etc. is appropriated gratuitously and this is guaranteed. However, when passing 1 year after delivery,
there is a case where I am allowed to consider as onerous repair after both consultation.
14. Others
When any questions and opinions are in the written matter of these delivery specifications, I will ask connection
of you from the company issue day within 45 days. In a connection no case, a written matter is consented to it
and employed within a term.

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